spc_stnv_000134

"Automatic Saturn V Page Test System."

IBM No: 65-825-1430

The abstract notes, "This paper describes the Automatic Saturn V Page Test System. The system is used to evaluate microminiature Unit Logic Device (ULD) circuits. A page is an assembly consisting of a magnesium- lithium frame, an input-output connector, test points, and multilateral printed circuit boards that interconnect the IUDs into logic circuits. The test system automatically performs tests for shorted voltages and shorted diodes, static logic function, and pulse function."

1965-05-01

Saturn V Collection

Box 13, Folder 33

University of Alabama in Huntsville Archives, Special Collections, and Digital Initiatives, Huntsville, Alabama

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spc_stnv_000119_000149

http://libarchstor.uah.edu:8081/repositories/2/archival_objects/17125